The SnSe crystal is a promising candidate in the field of thermoelectric materials. In order to elucidate basic physics in the SnSe system, here we report the heavily hole doping SnSe single crystals by the flux method (using alkali halide as solvent). Compared to bad-metal behavior of SnSe grown by the Bridgeman method, the flux-grown SnSe crystals show the metallic conductive behavior consistent with the Landau Fermi liquid (resistivity ρ ∼ T2) with temperatures ranging from 2 to 300 K. Combined angle-resolved photoemission spectroscopy and empirical Landau Fermi liquid theory, screening lengths λ of Coulomb electron–electron interaction U of SnSe grown by the flux method are 6.6 Å and 6.1 eV, which are much higher than those of normal metals. Remarkably, the excellent electrical conductivity (870 S/cm) of the SnSe crystal grown by the flux method at room temperature is attributed to the higher hole concentration (∼3.8 × 1019 cm−3) and large mobility (152.2 cm2 V−1 s−1). Meanwhile, these SnSe crystals still have large Seebeck coefficients (∼190 μV/K). Thus, the SnSe crystals grown by the flux method have an ultrahigh power factor [∼31.5 μW/(cm K2)] at room temperature, which is ten times larger than that of SnSe crystals grown by the Bridgeman method and as best as currently reported results. Our work shows a method for growing heavily hole-doped SnSe crystals, which provides a platform for understanding the electrical properties and improving its thermoelectric performance.

With the change of social structure and management mode, emergency social security incidents have become the focus of social security management. In order to solve the problems of insufficient overall performance and low security in the practical application of cloud management mode in traditional social security emergencies. With the use of improved pick-KX load balancing algorithm and RSA encryption algorithm, this paper optimizes the cloud computing model and applies it to the cloud management mode of emergent social security events. Then the optimized cloud management model is simulated and evaluated by the multi-level fuzzy comprehensive evaluation model. The simulation results reflect that the proposed cloud management model in this paper is able to effectively improve the management effect of social security events.

Doped BiCuSeO is one of the promising thermoelectric oxide candidates. However, the research on doping effects on the electrical transport properties of BiCuSeO, especially in crystalline samples, is still limited. Here, we studied the transport properties of doped BiCuSeO crystals, including three types of doping species (Rb, Sn, and Co) with varying concentrations. In the case of Rb-doped BiCuSeO crystals, few percentage (≤1%) Rb-doping make BiCuSeO display metallic behavior, while high one (≥2%) displays bad-metallic behavior. Both Sn- and Co-doped BiCuSeO crystals have similar electrical evolution as Rb-doped ones. The charge carriers of all these doped BiCuSeO crystals are holes, and the increased dopant concentration decreases the hole concentrations regardless of the type of dopant species. There is negative magnetoresistance (MR) in Rb- and Sn-doped BiCuSeO at low temperature (<15 K), which is due to the breakdown of weak localization by magnetic field B, but the MR behaviors in Co-doped BiCuSeO crystals are strongly correlated with their magnetic properties. The analysis of the temperature-dependent mobility of these doped BiCuSeO crystals substantiates that at low temperatures (<50 K), electron-impurity scattering dominates, while electron–phonon scattering dominates at high temperatures (>50 K). The evolution of the above-mentioned electrical/magneto-transport properties of doped BiCuSeO can be understood as follows: the dopant compensates the Bi-deficiency in pristine BiCuSeO crystals and decreases the hole concentration and leads to the metal–Anderson-insulator transition. These results may be valuable to optimize the electrical properties of layered compounds similar to BiCuSeO.

The temperature dependence of the transverse magnetoresistance in irradiated and unirradiated p‐type Si is studied in the range from 120 to 290 K. The magnetoresistance coefficients for the unirradiated [001] and [110] samples increases with decreasing sample temperature in the range from 160 to 290 K, however, this behavior is reversed below 160 K. It is proposed that this reversal is due to the double injection effect. The magnetoresistance coefficient for the irradiated [100] sample increases with decreasing sample temperature in the range of 120 to 290 K and is greater than that for the unirradiated [001] sample. This result can be explained by increased scattering due to the increased number of defects produced by irradiation. On the other hand, the magnetoresistance coefficient for the unirradiated [110] sample is found to be greater than that of the unirradiated [001] sample.