We describe the implementation of a scanning Hall probe microscope of outstanding magnetic field sensitivity (∼0.1 G) and unprecedented spatial resolution (∼0.35 μm) to detect surface magnetic fields at close proximity to a sample. Our microscope combines the advantages of a submicron Hall probe fabricated on a GaAs/Al0.3Ga0.7As heterostructure chip and the scanning tunneling microscopy technique for precise positioning. We demonstrate its usefulness by imaging individual vortices in high Tc La1.85Sr0.15CuO4 films and superconducting networks, and magnetic bubble domains.
Raman spectra of materials subject to strong electric field gradients, such as those present near a metal surface, can show significantly altered selection rules. We describe a new mechanism by which the field gradients can produce Raman-like lines. We develop a theoretical model for this "gradient-field Raman" effect, discuss selection rules, and compare to other mechanisms that produce Raman-like lines in the presence of strong field gradients. The mechanism can explain the origin and intensity of some Raman modes observed in SERS and through a near-field optical microscope (NSOM-Raman).
Raman spectroscopy in conjunction with near-field scanning optical microscopy is used to image Rb doped KTP within a spectral feature with high spatial resolution. We present Raman spectra as well as the first Raman images obtained in the near-field. Differences between near-field and far-field Raman measurements are discovered and discussed.
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