X-ray scintillation detectors based on metal halide perovskites have shown excellent light yield, but they mostly target applications with spatial resolution at the tens of micrometers level. Here, we use a one-step solution method to grow arrays of 15-μm-long single-crystalline CsPbBr 3 nanowires (NWs) in an AAO (anodized aluminum oxide) membrane template, with nanowire diameters ranging from 30 to 360 nm. The CsPbBr 3 nanowires in AAO (CsPbBr 3 NW/AAO) show increasing X-ray scintillation efficiency with decreasing nanowire diameter, with a maximum photon yield of ∼5 300 ph/MeV at 30 nm diameter. The CsPbBr 3 NW/AAO composites also display high radiation resistance, with a scintillation-intensity decrease of only ∼20–30% after 24 h of X-ray exposure (integrated dose 162 Gy air ) and almost no change after ambient storage for 2 months. X-ray images can distinguish line pairs with a spacing of 2 μm for all nanowire diameters, while slanted edge measurements show a spatial resolution of ∼160 lp/mm at modulation transfer function (MTF) = 0.1. The combination of high spatial resolution, radiation stability, and easy fabrication makes these CsPbBr 3 NW/AAO scintillators a promising candidate for high-resolution X-ray imaging applications.
X-ray microscopy is an essential imaging method in many scientific fields, which can be extended to three-dimensional (3D) using tomography. Recently, metal halide perovskite (MHP) nanomaterials have become a promising candidate for X-ray scintillators, due to their high light yield, high spatial resolution, and easy fabrication. Tomography requires many projections and therefore scintillators with excellent stability. This is challenging for MHPs, which often suffer from fast degradation under X-ray irradiation and ambient conditions. Here, we demonstrate that MHP scintillators of CsPbBr3 nanowires (diameter: 60 nm, length: 5–9 µm) grown in anodized aluminum oxide (CsPbBr3 NW/AAO) have sufficient stability for X-ray micro-tomography. A tomogram was taken with a Cu X-ray source over 41 h (dose 4.2 Gyair). During this period the scintillator brightness fluctuated less than 5%, which enabled a successful reconstruction. A long-term study with 2 weeks of continuous X-ray exposure (37.5 Gyair) showed less than 14% fluctuations in brightness and no long-term degradation, despite variations in the ambient relative humidity from 7.4 %RH to 34.2 %RH. The resolution was stable at (180 ± 20) 1pmm−1, i.e., about 2.8 micron. This demonstrates that CsPbBr3 NW/AAO scintillators are promising candidates for high resolution X-ray imaging detectors.
Scanning transmission X-ray microscopy, especially in combination with X-ray fluorescence detection (STXM-XRF) in the soft X-ray energy range, is becoming an increasingly important tool for life sciences. Using X-ray fluorescence detection, the study of biochemical mechanisms becomes accessible. As biological matrices generally have a low fluorescence yield and thus a low fluorescence signal, high detector efficiency (e.g. large solid angle) is indispensable for avoiding long measurement times and radiation damage. Here, the new AnImaX STXM-XRF microscope equipped with a large solid angle of detection enabling fast scans and the first proof-of-principle measurements on biomedical samples are described. In addition, characterization measurements for future quantitative elemental imaging are presented. research papers J. Synchrotron Rad. (2019). 26, 430-438 Lars Lü hl et al. Biomedical applications of STXM-XRF in the soft/tender energy range research papers J. Synchrotron Rad. (2019). 26, 430-438 Lars Lü hl et al. Biomedical applications of STXM-XRF in the soft/tender energy range research papers 436 Lars Lü hl et al. Biomedical applications of STXM-XRF in the soft/tender energy range J. Synchrotron Rad. (2019). 26, 430-438Figure 7Transmission image (top) and pseudo-colour image (bottom) for C (blue, BAT) and Fe (red, SPIO) for control tissue.
The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.
Coherent X-ray imaging techniques, such as in-line holography, exploit the high brilliance provided by diffraction-limited storage rings to perform imaging sensitive to the electron density through contrast due to the phase shift, rather than conventional attenuation contrast. Thus, coherent X-ray imaging techniques enable high-sensitivity and low-dose imaging, especially for low-atomic-number (Z) chemical elements and materials with similar attenuation contrast. Here, the first implementation of in-line holography at the NanoMAX beamline is presented, which benefits from the exceptional focusing capabilities and the high brilliance provided by MAX IV, the first operational diffraction-limited storage ring up to approximately 300 eV. It is demonstrated that in-line holography at NanoMAX can provide 2D diffraction-limited images, where the achievable resolution is only limited by the 70 nm focal spot at 13 keV X-ray energy. Also, the 3D capabilities of this instrument are demonstrated by performing holotomography on a chalk sample at a mesoscale resolution of around 155 nm. It is foreseen that in-line holography will broaden the spectra of capabilities of MAX IV by providing fast 2D and 3D electron density images from mesoscale down to nanoscale resolution.
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