Li can find itself a wide range of applications since it is the lightest metal. However, Li detection by microscopy-based techniques is problematic because of the highly susceptible nature during electron beam irradiation. ToF-SIMS is a versatile technique to detect Li but the detection of light materials is also problematic due to the large ion contaminated zone and low sputtering yield. By combining ToF-SIMS with a recently launched Xe ion source FIB-SEM, which has small ion contamination and high sputtering yield features, can produce more realistic data at near surface and below the surface region especially for the detection of lightweight materials such as Li. In this study, Li detection and mapping capabilities of ToF-SIMS attached to the FIB-SEM with Ga and Xe ion sources were discussed for Al incorporated Li 7 La 3 Zr 2 O 12 solid electrolyte sample that contains Li and Al rich regions at triple junctions. In spite of smoother milling from Ga source, Xe performs more precisely in Li mapping. Low ion contaminated zone, high sputtering yield and low straggling obtained from Monte Carlo simulations are the main advantages of Xe ion sources. The Li detection efficiency for Xe is higher than Ga source discriminating the LiAlO 2 phase placed at the triple junctions of grains and La 2 Zr 2 O 7 regions placed at the outer side of LLZO neighbouring the LiAlO 2 phase.
Surfaces of polycrystalline ferritic Fe–Cr steel with grain sizes of about 13 µm in diameter were investigated with surface sensitive techniques. Thin oxide layers, with a maximum thickness of about 100 nm, were grown by oxidation in air at temperatures up to 450°C and were subsequently characterized using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and atomic force microscopy. Correlative microscopy was applied, which allows for element-specific depth profiles on selected grains with a particular crystal orientation. A strong correlation between the grain orientation and the thickness of the oxide layer was found. The sequence in the oxidation growth rate of ferritic Fe–Cr steel crystal planes is found to be {011} > {111} > {001}, which is unexpectedly opposed to known Fe-based systems. Moreover, for the first time, the Cr/Fe ratio throughout the oxide layer has been determined per grain orientation. A clear order from high to low of {001} > {111} > {011} was detected.
A 3D reconstruction has been performed on a flat specimen after an interrupted in‐situ tensile tests. The sample consisted of austempered ductile cast iron (ADI) alloyed with 2.75% nickel. The analysis was performed by using a dual beam system (FIB‐SEM).
The procedure of this analysis consisted in studying the elastic‐plastic behaviour along with the nucleation and the growing of cracks in ADI at room temperature. For this purpose, a field emission scanning electron microscope (FE‐SEM) equipped with a tensile stage was used.
A systematic observation at the same location on the sample surface was used to clarify the tensile curves which are in agreement with deformation mechanisms. During the testing, decohesion of graphite nodules from the matrix was observed. The cracks initiated mainly at the interface of graphite nodule and the austenitic matrix. The elastic‐plastic region is connected with the plastic deformation of the matrix, growth and linking of microscopic cracks which are connected and finally leading to fracture of the sample.
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