We proposed a new method to improve the resolution of far object image in curving effective integral imaging system. Basically, the curving effective integral imaging(CEII) system can improve the resolution of the reconstructed images with an increased sampling rate of elemental images. However, in the case when an object located far from the lenslet array is picked up, the low resolution of the reconstructed images of the far object has been a primary problem because the sampling rate is very low. In order to solve this drawback, by using the direct pixel mapping(DPM) method the EIA picked up from a far object is transformed into a new EIA that virtually looks like the EIA picked up from the object originally located close to the lenslet array. From this new EIA, highly resolution-enhanced images of far object could be reconstructed in the CEII system. To show the feasibility of the proposed method, simulation results are compared with the conventional method.
In this paper, we propose a novel approach to enhance the recognition performance of a far and partially occluded three-dimensional (3-D) target in computational curving-effective integral imaging (CEII) by using the direct pixel-mapping (DPM) method. With this scheme, the elemental image array (EIA) originally picked up from a far and partially occluded 3-D target can be converted into a new EIA just like the one virtually picked up from a target located close to the lenslet array. Due to this characteristic of DPM, resolution and quality of the reconstructed target image can be highly enhanced, which results in a significant improvement of recognition performance of a far 3-D object. Experimental results reveal that image quality of the reconstructed target image and object recognition performance of the proposed system have been improved by 1.75 dB and 4.56% on the average in PSNR (peak-to-peak signal-to-noise ratio) and NCC (normalized correlation coefficient), respectively, compared to the conventional system.
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