ABSTRACT. The objective of the paper has been given on observations based on studies of the three samples of copper-iron (Cu-Fe) alloy have been prepared from 3gm mass of copper of 99.9 % purity powder and adding 1gm weight of iron powder and adding 1.5gm weight of iron powder. A discussion about simple and low cost preparation of Cu-Fe alloy by Mini Mill 2 Panalytical and preparation of the sample was rotating at 10 min and in case of grinding samples at high speed 300 rpm. Herzog press Panalytical used to produce pressed powder Cu-Fe alloy. The characters of CuFe particles are depending on their size, shape and chemical surroundings. X-Ray Diffraction (XRD) (Model: Panalytical Empyrean) study is most important tool used in powder materials science. For studied three samples the value of (111) plane has the highest value compared to other planes. The spectra obtained were analyzed using X-ray fluorescence (XRF) (Model: Rigaku-NEX CG). From the spectra obtained, there were some elements to be present in the sample were Cu-Fe. The intensity of Cu pure is larger than impurity copper samples analysis by XRD and XRF. Also impurity affects the intensity, (2θ) position and shape of the X-ray spectra.

Abstract-Lead sulphide (PbS) films were prepared by the chemical spray pyrolysis technique using a solution of Lead nitrate and thiourea. PbS films were deposited (prepared) on glass substrate at varied temperature (250-350 o C). Effects of substrate temperature on the structural characteristics of the films were studied. The X-ray diffraction patterns' results reveal that the all of PbS films have a face centered cubic structure. The X-ray diffraction study showed that irrespective of substrate temperature all the films exhibits a preferred orientation along the (200) plane. The degree of preferred orientation increased with the substrate temperature. It was observed that the increase of the substrate temperature increase the diffraction peak intensity of (200) plane which resulted in increase in grain size and good crystallinity of the films.Index Terms-Chemical spray pyrolysis, lead sulphide, semiconductor, thin film.

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