Photoluminescence spectra have been investigated for LP€-grown AI,Gal-,Sb at 77 K, and five emission peaks observed. These emissions have been interpreted by taking into account one shallow acceptor level and two native defect levels in the energy band diagram. The shallow acceptor level is located at about 30 meV above the valence band, which may be due to the complex defect VGaGaSb.The native defects introduce two levels, which are about 90 meV below the rl minimum and about 160 meV below the Ll minimum. The defect levels may be related to complex defects of the Sb vacancy.
The LPE grown AlxGa1−xSb was investigated by means of TEM, a carrier profiler and PL. The TEM image showed the dissociated 60° dislocations and Lomer-Cottrell sessile dislocation formed by the reaction of two dissociated 60° dislocations on different {111} planes. The EPMA measurement showed that Sb concentrations at the dislocation were lower than the stoichiometric composition. The epi-layer grown at 400°C had a relatively uniform carrier concentration of ∼7×1016cm−3. The PL spectra showed five emission peaks in 0≦×≦0.29. One shallow acceptor level and two native defect levels were introduced to interpret these PL emissions. The shallow acceptor level of Ev+∼30meV may be due to the defect of VGaGaSb. The native defects introduce two levels of EΓ1 - ∼90meV and EL1 - ∼160meV. The defect levels may be related to the complex defect of the Sb vacancy.
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