Using time‐resolved photoluminescence spectroscopy on GaInN/GaN multiple quantum well structures, we analyze the radiative and nonradiative processes contributing to the “green gap” in GaN‐based light emitting devices. We observe that it is only partly caused by a reduced oscillator strength due to the Quantum Confined Stark Effect (QCSE) which becomes stronger with increasing indium concentration and well width. As the dominant effect we observe a reduction of nonradiative lifetimes when the indium concentration is increased. For higher indium concentrations, we find an additional nonradiative recombination path that might be attributed to an increased generation of defects like misfit dislocations, nitrogen vacancies and/or indium clusters within the optically active region. (© 2011 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

The origin of the green gap for GaInN/GaN quantum wells is investigated via temperature-dependent time-resolved photoluminescence spectroscopy. A strong correlation between nonradiative lifetimes and total strain energy is observed, although the wells are almost fully strained. We discuss this observation in terms of nonradiative recombination at defects which contribute to a beginning partial relaxation. The formation energy of a defect is likely reduced by the amount of its released strain energy. We therefore expect an exponential dependence of the defect density on this released strain energy. Our measured nonradiative lifetimes are consistent with a cumulative strain driven generation of defects.

Nonradiative loss processes are a major concern in nitride-based light emitting devices. Utilizing optical gain measurements on GaInN/GaN/AlGaN laser structures, we have studied the dependence of the total recombination rate on excess carrier density, up to rather high densities. From a detailed quantitative analysis, we find a room-temperature Auger recombination coefficient of 1.8 ± 0.2 × 10−31 cm6/s in the bandgap range 2.5 − 3.1 eV, considerably lower than previous experimental estimates. Thus, Auger recombination is expected to be significant for laser diodes, while it is not likely to be a major factor for the droop observed in light-emitting diodes.

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We have studied the growth of GaInN/GaN quantum wells on various polar, nonpolar and semipolar planes. From a detailed x-ray diffraction analysis, we derive the strain state and the composition of the quantum wells. The optical emission energy is obtained from photoluminescence spectra and modelled taking into account the deformation potentials and the Stark shifts. Both x-ray and optical data consistently show that indium incorporation is identical on the polar, nonpolar and semipolar planes within the experimental uncertainty.