Diffraction enhanced imaging (DEI) is a phase-sensitive x-ray imaging technique based on the use of an analyser crystal placed between the sample and the detector. In the recent years, DEI has proven outstanding image quality both in material science and medical imaging, as well as the capability to provide quantitative information. However, in the case of objects featuring a fine refractive structure, which is not resolved by the spatial resolution of the detector, the fundamental requirements for the applicability of the DEI algorithm are not fulfilled. Herein a new algorithm is presented that takes into account this particular case. Formally similar to DEI, it allows obtaining quantitative information on the absorption and refraction properties of the object. Thus, structures in the sub-pixel length scale can be imaged and analysed quantitatively.

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