Scanning electron microscopy (SEM) is one of the popular methods for imaging the microstructure and morphology of materials. In an SEM, a low-energy electron beam hits the material and scans the surface of the sample. As the beam reaches and enters the material, various interactionsoccur that result in the emission of photons and electrons from or near the sample surface. To produce an image, the received signal produced by the electron-sample interaction is detected with different types of detectors, depending on the her SEM mode used. There are various his SEM modes for characterization of materials including biomaterials. B. X-ray imaging, secondary electron imaging, backscattered electron imaging, electron channeling, Auger electron microscopy.
Doped Advanced semiconductor materials with different properties are useful for early diagnosis and improved treatment in medical research. This is essential for advanced medical technology and lower mortality rates. New research on impurity-doped nano crystals is important. These dopants can directly affect electron transport in semiconductors, tune the optical properties of nano materials in desirable ways, and impart specific properties to the host. In this research report, we first discuss the factors that need to be considered to systematically control the production of these doped semiconductor materials, then describe various doped materials and typical synthetic approaches and techniques. Innovations in nanotechnology and materials design and their application in early diagnosis and treatment are believed to minimize the number of new cases of related diseases and reduce mortality.1,2,3 From natural to man-made materials, Doped semiconductor nanostructures, including inorganic and organic semiconductors, are increasingly attracting the attention of researchers and scientists worldwide
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