By use of optical spectrum technology, the spectra of X-ray induced by highly charged 40 Ar q+ ions interacting with Au surface have been studied. The results show that the argon Kα X-ray were emitted from the hollow atoms formed below the surface. There is a process of multi-electron exciting in neutralization of the Ar 16+ ion, with electronic configuration 1s 2 in its ground state below the solid surface. The yield of the projectile Kα X-ray is related to its initial electronic configuration, and the yield of the target X-ray is related to the projectile kinetic energy.Keywords: highly charged ion, hollow, multi-electron excitation, X-ray.When a highly charged ion with many inner shell holes, provided by the electron cyclotron resonance (ECR) ion source, is approaching to a metallic surface, the conducting-band electrons in the metal can resonantly transfer into the high orbits of the projectile with the principal quantum number / n q W ≈ (q is the charge state of the projectile and W the work function of the metal). As the distance of the projectile to the surface is smaller than a critical value of c 2 / , R q W ≈ the potential barrier between the ion and the surface will drop below the Fermi level. In this way, the ion could be temporarily neutralized to form a hollow atom with outer shell occupied and inner shells empty. For example, when Ar 18+ impacts on the Au surface, the hollow argon atom could be formed at R c =33 a.u. with n=20, and when U 92+ impacts on the Au surface, the hollow uranium

A real-time confocal scanning optical microscope is described. It is capable of generating 640 frames per second with 7000 lines per frame. It achieves this speed by simultaneously illuminating several thousand pinholes arranged in a spiral pattern on a rotating disk. An optical isolator is used to eliminate reflections from the surface of the disk. This type of microscope should have the same range and transverse definitions as a standard, single pinhole, confocal microscope.

A new type of real -time confocal scanning optical microscope, with the same measured resolution as a conventional confocal scanning optical microscope, is described. The system uses a rotating Nipkow disk with 150,000 pinholes etched in it, to yield a 640 frame /sec, 7000 -line image.The transverse definition is of the order of 0.3 pm , and the 3 dB range resolution, with a 0.8 N.A. objective lens, is better than 0.75 um .

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