Arrays of Ni1-xMnxFe2O4 (x = 0.0, 0.25, 0.5, 0.75) nanowires with an average diameter of about 80 nm are prepared by porous anodic aluminum oxide membrane poured sol technique. X-ray diffraction analysis shows that the nickel manganese ferrites nanowires with cubic spinel structure are synthetized. Scanning electron microscopy and transmission electron microscope images indicate that the nanowire arrays are composed of prolate spheroids with different crystal orientations. Magnetic measurements show that saturation magnetization increases and then decreases with Mn increasing. The change is related to the location and the substitution of ion in spinel structure. Compared with of block material NiFe2O4, the saturation magnetization of nickel ferrite nanowire arrays is low. This is due to the fact that the noncollinear magnetic structure in nanowire arrays become predominant.
The non-magnetic element Al and magnetic element Co doped ZnO films are prepared by dc magnetron sputtering The films were annealed first in vacuum and then in air. The crystal structures are analyzed by x-ray diffraction (XRD) and magnetic properties are measured by Physical Properties Measurement System (PPMS). The results show that annealing ambience has a great influence on structure and magnetic property of sample Al doped ZnO films annealed in vacuum show no room temperature ferromagnetism, but the ones annealed in air show room temperature ferromagnetism. The room temperature ferromagnetism may be associated with enhanced charge transfer between Al and ZnO films annealed in air. And for Co doped ZnO films annealed in air annealed, the ferromagnetism is weakened. The change of magnetism may be related to the competition between enhanced magnetism resulting from charge transfer between Al and ZnO and reduced magnetism resulting from interstitial Co atoms oxygenated.
Al doped ZnO films of different thickness have been prepared on glass substrates by dc magnetron sputtering, these films were annealed in different atmosphere . The crystal structures were analyzed by x-ray diffraction (XRD), and the magnetic properties were measured by a Physical Properties Measurement System (PPMS) with the magnetic field paralleled to the films plane. The results indicate that with increase of the thickness, the crystallinity of the thin films gets better and the crystallites of the Al doped ZnO thin films increase gradually, whereas the internal stresses decreased. The results show the films annealed in air shows obvious room temperature ferromagnetism. With the increase of the film thickness the saturation magnetization is enhanced, and the coercivity is weakened.
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