Accurate and robust detection of multi-class objects in optical remote sensing images is essential to many real-world applications such as urban planning, traffic control, searching and rescuing, etc. However, state-of-the-art object detection techniques designed for images captured using ground-level sensors usually experience a sharp performance drop when directly applied to remote sensing images, largely due to the object appearance differences in remote sensing images in term of sparse texture, low contrast, arbitrary orientations, large scale variations, etc. This paper presents a novel object detection network (CAD-Net) that exploits attention-modulated features as well as global and local contexts to address the new challenges in detecting objects from remote sensing images. The proposed CAD-Net learns global and local contexts of objects by capturing their correlations with the global scene (at scene-level) and the local neighboring objects or features (at object-level), respectively. In addition, it designs a spatial-and-scale-aware attention module that guides the network to focus on more informative regions and features as well as more appropriate feature scales. Experiments over two publicly available object detection datasets for remote sensing images demonstrate that the proposed CAD-Net achieves superior detection performance. The implementation codes will be made publicly available for facilitating future researches.

Few-shot object detection has been extensively investigated by incorporating meta-learning into region-based detection frameworks. Despite its success, the said paradigm is still constrained by several factors, such as (i) low-quality region proposals for novel classes and (ii) negligence of the inter-class correlation among different classes. Such limitations hinder the generalization of base-class knowledge for the detection of novel-class objects. In this work, we design Meta-DETR, which (i) is the first image-level few-shot detector, and (ii) introduces a novel inter-class correlational meta-learning strategy to capture and leverage the correlation among different classes for robust and accurate few-shot object detection. Meta-DETR works entirely at image level without any region proposals, which circumvents the constraint of inaccurate proposals in prevalent few-shot detection frameworks. In addition, the introduced correlational meta-learning enables Meta-DETR to simultaneously attend to multiple support classes within a single feedforward, which allows to capture the inter-class correlation among different classes, thus significantly reducing the misclassification over similar classes and enhancing knowledge generalization to novel classes. Experiments over multiple few-shot object detection benchmarks show that the proposed Meta-DETR outperforms state-of-the-art methods by large margins. The implementation codes are available at https://github.com/ZhangGongjie/Meta-DETR.

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Automated defect inspection is critical for effective and efficient maintenance, repair, and operations in advanced manufacturing. On the other hand, automated defect inspection is often constrained by the lack of defect samples, especially when we adopt deep neural networks for this task. This paper presents Defect-GAN, an automated defect synthesis network that generates realistic and diverse defect samples for training accurate and robust defect inspection networks. Defect-GAN learns through defacement and restoration processes, where the defacement generates defects on normal surface images while the restoration removes defects to generate normal images. It employs a novel compositional layer-based architecture for generating realistic defects within various image backgrounds with different textures and appearances. It can also mimic the stochastic variations of defects and offer flexible control over the locations and categories of the generated defects within the image background. Extensive experiments show that Defect-GAN is capable of synthesizing various defects with superior diversity and fidelity. In addition, the synthesized defect samples demonstrate their effectiveness in training better defect inspection networks.