Cellular Ti-6Al-4V materials with open-cell pore array structures have been fabricated by Electron Beam Melting (EBM) using an Arcam A2X system. The test samples were cylinders 20 mm diam. x 40 mm high, with pore diameters of 1.75 - 2.5 mm and porosities in the range of 61 - 83%. The structures were based on a simple cubic pore array.Sample stiffness and strength were both found to decrease with increasing porosity, exhibiting mean Young’s moduli of 3.5 – 15.6 GPa and mean yield stresses of 20.2 – 93.6 MPa. Finite element analysis (FEA) using ANSYS was performed to model the stress-strain curves for a representative volume, using measured bulk material properties. Stiffness and strength were significantly overestimated by this method, but better agreement with measured data was obtained when the representative volume was extended along the compression axis.
Thin films of oxygen-conducting materials are expected to exhibit enhanced oxygen permeability, due to their reduced diffusion path. Two such materials, yttria-stabilised zirconia (YSZ) and ceria gadolinium oxide (CGO), were deposited onto anodic alumina substrates by electron beam evaporation of the parent materials. Continuous films 200-400 nm thick were characterised through SEM and XRD analysis. It was found that the substrate temperature during deposition strongly influenced the structure and stability of the films, with the original simple cubic structure being retained at deposition temperatures above 450 °C. Attempts to deposit thin films of a yttria-doped SrCoO3-δ perovskite were unsuccessful, due to melting of the material during deposition and thermal diffusion into the substrate.
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