The distribution of electrons injected into CdS in a scanning electron microscope is imaged using an optical beam deflection technique. The contributions to the deflection due to carrier density, electron recombination, thermalization, and diffusion are identified for both pulsed and periodically modulated electron beams. The electron interaction volumes are analyzed to determine the energy dependence of the primary electron range and the lateral spread, presumably due to scattering of fast secondary electrons. The electron distributions are compared with Monte Carlo simulations.
That the ridge-type Ti:LiNbO 3 Y-junction waveguide is a better optical splitter than the conventional Ti-diffused one is demonstrated by beam propagation method involving the Runge-Kutta algorithm. Also, our simulation shows that some spatially-discrete radiation modes appear within the gap between the both arms made of the ridge structures due to the Fabry-Perot resonance effect.
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