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In this work, the impact of six different anti-reflection coating (ARC) layers has been investigated using PC1D simulation software. Simulation shows that the range of 500-700 nm would be suitable for designing an ARC. Designing a single-layer silicon nitride (Si 3 N 4) ARC for 600 nm wavelength and with a thickness of 74.257 nm, a silicon solar cell with 20.35% efficiency has been simulated. Very closely followed by a 20.34% efficient silicon solar cell with 74.87 nm thick zinc oxide (ZnO) ARC layer. Significant increase in efficiency has been observed by applying ARC in respect to not applying any kind of ARC. After efficient solar cell modeling, optimum efficiency of 20.67% is being achieved by using SiO 2 surface passivation and Si 3 N 4 ARC layer. The effects on voltage, current, photovoltaic efficiency, reflectivity and external quantum efficiency due to ARCs are also represented in this work.

Solar panel plays a major role in the renewable energy sector. Unfortunately substandard and unspecified solar panels are seen now a days in the market of many countries. Furthermore, solar panel testing equipment is not available everywhere and is a costly device. So, to fulfill customer rights and to know the efficiency of the solar panels, a simple portable solar panel efficiency measurement system has been designed and developed. The system includes a single Ardunio Uno, a voltage sensor, a current sensor (ACS712), a multi meter and a lux meter. The measurement has been taken under real sun conditions. The system determines maximum voltage (V max), maximum current (I max), maximum power (P m), fill factor (FF) and efficiency (η) of the solar panel. The system reveals that the efficiency of a 10 W, 8 W and 0.65 W silicon solar panel are 9.65%, 8.59% and 8.4% respectively.

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