A new empirical field calibration equation is presented. This relationship is obtained from a detailed numerical study of the field distribution within a real field ion microscope. The equation separates the important shank angle effect from the other geometric influences. Comparison is made of the predicted field with actual values.
A combination of numerical and analytical techniques is used to develop an improved empirical formula for the electric field near the surface of field emitters. The new relationship is shown to account accurately for the shank variation and the dependence of the field upon polar angle. Also discussed is the suitability of empirical formulas for ion trajectory calculations.
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