We present a hydrodynamic model to simulate the excitation by optical beating of plasma waves in nanometric field effect transistors. The biasing conditions are whatever possible from Ohmic to saturation conditions. The model provides a direct calculation of the time-dependent voltage response of the transistors, which can be separated into an average and a harmonic component. These quantities are interpreted by generalizing the concepts of plasma transit time and wave increment to the case of nonuniform channels. The possibilities to tune and to optimize the plasma resonance at room temperature by varying the drain voltage are demonstrated.

In the framework of analytical and hydrodynamic models for the description of carrier transport and noise in high electron mobility transistor/field-effect transistor channels the main features of the intrinsic noise of transistors are investigated under continuous branching of the current between channel and gate. It is shown that the current-noise and voltage-noise spectra at the transistor terminals contain an excess noise related to thermal excitation of plasma wave modes in the dielectric layer between the channel and gate. It is found that the set of modes of excited plasma waves can be governed by the external embedding circuits, thus violating a universal description of noise in terms of Norton and Thevenin noise generators.