A new compact Reconfigurable Frequency Measurement (RFM) device, based on interferometry is presented in this paper. The device combines the advantages of reconfigurability and fractal geometry. The interferometer uses a Wilkinson power divider connected to two microstrip delay lines; one of these corresponds to the second iteration of the Hilbert fractal curve. PIN diode switches are properly placed in the fractal delay line to achieve a 3-bit circuit, which operates in the 2.7-4.5 GHz range. The design and simulations presented are done using a full wave EM simulator, and the frequency responses of the circuit are then shown and compared to measured results.
This paper presents four frequency selective surfaces (FSSs) to be used in an instantaneous frequency measurement (IFM) systems. The FSS based on simple dipoles have a frequency response corresponding to the characteristics of frequency discriminators. An IFM system with 4‐bits is shown with resolution around 300 MHz. The system contains 16 distinct frequency sub‐bands between 3.21 and 8.75 GHz. CST software simulations and measurements of insertion loss are presented and compared with theoretical results to provide the binary codes of the system.
This work presents an RFSS with two discrete states, corresponding to a pass‐band or stop‐band response depending on PIN diode biasing. The RFSS behaves as an array of cross dipole elements when all diodes are in the OFF‐state and as a grid when the diodes are in the ON‐state. The cross dipole patch array has a stop‐band filter response and the grid behaves as a pass‐band filter at the design frequency of 1.6 GHz. Simulation and measurements of insertion loss are presented, demonstrating the switchable band‐pass to band‐stop response.
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