Accumulation of F-type defects under irradiation of MgO crystals by 0.23-GeV 132 Xe ions with fluence varying by three orders of magnitude has been investigated via the spectra of optical absorption and low-temperature cathodoluminescence. The number of single centers continuously increases with fluence without any marks of saturation. At the highest fluence, a mean volume concentration of 3.1 × 10 19 and 3.35 × 10 19 cm −3 is reached for F and F + centers, respectively. The F + emission strongly dominates in the cathodoluminescence of irradiated MgO and its enhancement with fluence is detected. However, the creation efficiency of theF2 aggregate centers is very low and fluence dependence has a complicated shape. Radiation-induced changes of micro-mechanical properties of the same samples have been analysed; the depth profiles of hardening correlate with the ion energy loss. A joint contribution of ionization and impact mechanisms in the formation of structural defects under MgO irradiation with Xe ions is considered.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.