A new learning method for classification problems that is suitable for integrated circuit implementation is presented. The method, which outperforms current approaches in many data sets, is based on a structural description of the learning set represented by a planar graph. The final classification function is composed of a hierarchical mixture of local experts, which yields a large margin classifier for the whole learning set. Since it is based only on distance calculations, on-chip learning can also be executed. The method is also appropriate for online and incremental learning, since model parameters are obtained directly from the data set, without need of user interaction for learning.
Currently Mutual Information has been widely used in pattern recognition and feature selection problems. It may be used as a measure of redundancy between features as well as a measure of dependency evaluating the relevance of each feature. Since marginal densities of real datasets are not usually known in advance, mutual information should be evaluated by estimation. There are mutual information estimators in the literature that were specifically designed for continuous or for discrete variables, however, most real problems are composed by a mixture of both. There is, of course, some implicit loss of information when using one of them to deal with mixed continuous and discrete variables. This paper presents a new estimator that is able to deal with mixed set of variables. It is shown in experiments with synthetic and real datasets that the method yields reliable results in such circumstance.
This paper presents a Semi-Supervised Feature Selection Method based on a univariate relevance measure applied to a multiobjective approach of the problem. Along the process of decision of the optimal solution within Pareto-optimal set, atempting to maximize the relevance indexes of each feature, it is possible to determine a minimum set of relevant features and, at the same time, to determine the optimal model of the neural network.
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