Thermal-induced infrared emission spectroscopy is reviewed, with emphasis on developments in theory and experiment. The theory associated with obtaining thermal-induced infrared emittance spectra as a function of sampling optics is discussed. The FT-IR configuration and data reduction methods needed to properly obtain high-quality spectra, close to room temperature, are also considered. Optical and experimental parameters which affect the spectrum are demonstrated by example, with a discussion of methods which optimize the signal-to-noise ratio. The applications shown range from polymer films on both metal and semiconductor surfaces to a single filament analyzed by micro-emission spectroscopy.
Among the many advantages of Raman spectroscopy for polymer characterization, low frequency data have been the least exploited. Results are presented on the use of low frequency Raman data on polyester fibers for determining the relative specific heats, and the degree of amorphous orientation. Background theory is presented.
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