In this paper, a systematic procedure to derive equivalent circuit networks accurately reproducing the frequency response of the input impedance of magnetic cores in a broad frequency range is presented. The proposed procedure foresees to represent the effective complex permeability spectra of a magnetic core (i.e., the permeability resulting from the superposition of intrinsic material properties and effects due to structural features of the core) by a high-order Debye series expansion, which is subsequently synthesized into suitable Foster and Cauer networks. Such networks can be implemented in any circuit simulator, and are particularly favorable for timedomain transient simulation since they can be easily combined with hysteresis models. Two nanocrystalline tape-wound cores and a commercial bulk current injection probe are used as test cases to prove the effectiveness of the proposed method both in terms of accuracy and ease of implementation.
The Pulse Current Injection (PCI) technique is foreseen by several international Electromagnetic Compatibility (EMC) standards to test the vulnerability of electrical/electronic units to intense transient electromagnetic disturbances. In this work, equivalent circuit modeling of a commercial PCI generator is addressed by using a non-intrusive characterization procedure at the external port, which does not require information on internal parameters. To this end, the PCI generator is firstly characterized in the frequency domain by using a vector network analyzer. Then a multi-goal optimization procedure is exploited to assign proper values to the involved circuit parameters. The initial voltage across the internal capacitor, which determines the pulse intensity, is then optimized for each pulse level starting from time-domain measurement under different conditions. Eventually, the proposed model is used to predict the time-domain behavior of a simplified PCI setup with ad-hoc injection coupler, and the simulation results show satisfactory agreement with measurements.
In this letter, experimental characterization and behavioral modeling of an off-the-shelf damped sinusoidal wave generator operating at different frequencies are addressed. Two modeling strategies are developed which lead to an active and a passive circuit representation of the generator, whose involved parameters are optimized by making use of time-domain measurement results obtained with the generator connected to different load impedances. It is shown that either the active or the passive model can assure accurate prediction of the generated waveforms, depending on the specific frequency. The proposed models can be effortlessly implemented in common circuit simulators, and used for systematic design of injection devices for transient conducted susceptibility testing as well as for simulation of the corresponding test setups. As an illustrative example, the proposed models are exploited to predict the actual waveform induced at the input pins of the device under test in a simplified pulse current injection test setup.
In this paper, experimental characterization and behavioral modeling of an off-the-shelf damped sinusoidal wave generator operating at different frequencies are addressed. Two modeling strategies are developed which lead to an active and a passive circuit representation of the generator, whose involved parameters are optimized by making use of time-domain measurement results obtained with the generator connected to different load impedances. It is shown that either the active or the passive model can assure accurate prediction of the generated waveforms, depending on the specific frequency. The proposed models can be effortlessly implemented in common circuit simulators, and used for systematic design of injection devices for transient conducted susceptibility testing as well as for simulation of the corresponding test setups. As an illustrative example, the proposed models are exploited to predict the actual waveform induced at the input pins of the device under test in a simplified pulse current injection test setup.
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