The liquid deposition
of thin films requires a thorough understanding
of the underlying drying process, as it is an essential subprocess,
where many defects may arise. To complement experimental studies,
the present study uses a laser Michelson interferometer to visualize
the vapor cloud of evaporating liquid films. The recorded interferometric
patterns are evaluated using windowed Fourier filtering and a novel
phase-unwrapping algorithm to allow for a robust analysis. Thin solvent
stripes of different lengths are combined to yield a quantitative
two-dimensional distribution of the solvent vapor concentration along
a thin liquid stripe. The results show a considerable influence of
natural convection during evaporation.
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