Electrical energy storage systems (EESSs) with high energy density and power density are essential for the effective miniaturization of future electronic devices. Among different EESSs available in the market, dielectric capacitors relying on swift electronic and ionic polarization-based mechanisms to store and deliver energy already demonstrate high power densities. However, different intrinsic and extrinsic contributions to energy dissipations prevent ceramic-based dielectric capacitors from reaching high recoverable energy density levels. Interestingly, relaxor ferroelectric-based dielectric capacitors, because of their low remnant polarization, show relatively high energy density and thus display great potential for applications requiring high energy density properties. In this study, some of the main strategies to improve the energy density properties of perovskite lead-free relaxor systems are reviewed, including (i) chemical modification at different crystallographic sites, (ii) chemical additives that do not target lattice sites, and (iii) novel processing approaches dedicated to bulk ceramics, thick and thin films, respectively. Recent advancements are summarized concerning the search for relaxor materials with superior energy density properties and the appropriate choice of both composition and processing routes to match various applications’ needs. Finally, future trends in computationally-aided materials design are presented.
Highly textured Ba0.5Sr0.5TiO3 and Ba0.6Sr0.4TiO3 thin films have been successfully processed using chemical solution deposition (CSD) techniques and annealed at different temperatures to investigate the influence on crystal growth. Microstructure and texture have been evaluated using SEM and XRD techniques. The films showed a homogeneous thickness of ~120 nm and the grain growth seemed to be highly influenced by the annealing temperature. Moreover, by tuning the deposition and annealing conditions, an almost epitaxial growth of Ba0.6Sr0.4TiO3 on the platinized silicon substrate has been achieved. Nevertheless, the samples showed severe cracking due to the strain imposed by the substrate or due to the growing direction.
In ceramic thin films, choosing an appropriate sample preparation method for transmission electron microscopy (TEM) analyses is of paramount importance to avoid preparation-induced damage and retain nanoscale features that require investigation. Here we compare two methods of TEM thin film sample preparation, namely conventional wedge polishing and focused ion beam (FIB) based lift out preparation applied to ferroelectric barium titanate (BaTiO3, BT) thin films made by chemical solution deposition (CSD). The aim of the work is to determine the pros and cons of each method considering not only the quality of the TEM specimen, but also aspects such as availability, ease of use, and affordability. Besides some limitations on the selection of visualized area due to thickness constraints on the FIB-made sample, both methods offer the capability to prepare samples with very comparable quality, as indicated by achieving the same thickness, a largely agreeing microstructure, no secondary phases on the diffraction pattern, and good atomic resolution. This last observation is especially important in the current context of material science, where more nanoscale phenomena are becoming the subject of study. The wedge polishing method, however, is deemed more affordable in terms of instrumentation, as it only requires a tripod polisher, a polishing wheel, and a precision ion polishing system, whereas the lift out method requires a scanning electron microscope (SEM) equipped with an FIB system. We believe that this work serves groups working on ferroelectric thin films in preparing TEM samples in a more effective and uncomplicated manner, facilitating progress in understanding this fascinating class of materials.
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