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The results of a Compton scattering study on polycrystalline rhodium are presented. The measurements are carried out using 59.54 keV y-rays on a sample of 0.13 mm thickness. The renormalisedfree-atom approach is applied to calculate the spherically averaged Compton profile for R h for various 4d-5s electronic configurations. Best agreement between measured and calculated values is found for the 4d85s1 electron configuration. These results a.re also comparcd with the recent band structure cslcuIation for electron momentum distribution in Rh.

In this article some undergraduate laboratory experiments based on x-ray fluorescence are described. The characteristic x rays have been induced by irradiating the samples with 59.54-keV gamma rays from an 241Am radioisotope and analyzed with a planar Ge detector. Typical results from student experiments are presented. Variation of the fluorescence x-ray intensity with thickness has been studied for Ag and AgBr samples. These data are then used to determine absorption coefficients for AgKα x rays in the two samples and relative concentration of Ag and Br in the AgBr sample. Some comments on the quantitative analysis from x-ray fluorescence are also made.

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