An expression for the temperature coefficients of resistance of thin metal films is derived wherein size effects, thermal strain and difference in the thermal expansion coefficients between film and its substrate are taken into account.

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An expression tbr the electrical conductivity of thin metal wires of a circular cross-section has been derived taking account of conduction-electron scattering at grain boundaries and the wire surface. An angular-dependent specularity parameter has been introduced and possible fluctuations of the wire diameter along its length have been taken into account. Boltzmann transport equations have been solved for the boundary conditions proposed by Dingle.