The implantation of He ions in UO 2 polycrystals induces a strain in the implanted layer which can be characterized using Laue micro X-ray diffraction (m-XRD). The strain tensor resulting from the ion implantation may not be reduced to a single out-of-plane strain component: it also has nonzero shear components. Their strong dependence upon crystal orientation is modeled using elasticity theory. This work demonstrates the potential of Laue m-XRD for characterizing radiation effects in materials. research papers J. Appl. Cryst. (2012). 45, 826-833 Axel Richard et al. Strains in light-ion-implanted polycrystals 827 research papers J. Appl. Cryst. (2012). 45, 826-833 Axel Richard et al. Strains in light-ion-implanted polycrystals 829
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