At low energy scales charge transport in the insulating Si:P is dominated by activated hopping between the localized donor electron states. Thus, theoretical models for a disordered system with electron‐electron interaction are appropriate to interpret the electric conductivity spectra.With a newly developed technique we have measured the complex broadband microwave conductivity of Si:P from 100 MHz to 5 GHz in a broad range of phosphorus concentration n /nc from 0.56 to 0.95 relative to the critical value nc = 3:5 × 1018 cm–3 corresponding to the metal‐insulator transition driven by doping. At our base temperature of T = 1.1 K the samples are in the zero‐phonon regime where they show a super‐linear frequency dependence of the conductivity indicating the influence of the Coulomb gap in the density of the impurity states. At higher doping n → nc , an abrupt drop in the conductivity power law σ1(ω) ∼ ωα is observed. The dielectric function ε1 increases upon doping following a power law in (1 – n /nc ). Dynamic response at elevated temperatures has also been investigated. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
We perform broadband phase sensitive measurements of the reflection coefficient from 45 MHz up to 20 GHz employing a vector network analyzer with a 2.4 mm coaxial sensor which is terminated by the sample under test. While the material parameters (conductivity and permittivity) can be easily extracted from the obtained impedance data if the sample is metallic, no direct solution is possible if the material under investigation is an insulator. Focusing on doped semiconductors with largely varying conductivity, here we present a closed calibration and evaluation procedure for frequencies up to 5 GHz, based on the rigorous solution for the electromagnetic field distribution inside the sample combined with the variational principle; basically no limiting assumptions are necessary. A simple static model based on the electric current distribution proves to yield the same frequency dependence of the complex conductivity up to 1 GHz. After a critical discussion we apply the developed method to the hopping transport in Si:P at temperature down to 1 K.
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