We study a one dimensional directed polymer model in an inverse-gamma random environment, known as the log-gamma polymer, in three different geometries: point-to-line, point-to-half-line and when the polymer is restricted to a half-space with end point lying free on the corresponding half-line. Via the use of A.N.Kirillov's geometric Robinson-Schensted-Knuth correspondence, we compute the Laplace transform of the partition functions in the above geometries in terms of orthogonal Whittaker functions, thus obtaining new connections between the ubiquitous class of Whittaker functions and exactly solvable probabilistic models. In the case of the first two geometries we also provide multiple contour integral formulae for the corresponding Laplace transforms. Passing to the zero-temperature limit, we obtain new formulae for the corresponding last passage percolation problems with exponential weights.
In this paper, we deal with the problem of efficiently assessing the higher order vulnerability of a hardware cryptographic circuit. Our main concern is to provide methods that allow a circuit designer to detect early in the design cycle if the implementation of a Boolean-additive masking countermeasure does not hold up to the required protection order. To achieve this goal, we promote the search for vulnerabilities from a statistical problem to a purely symbolical one and then provide a method for reasoning about this new symbolical interpretation. Eventually we show, with a synthetic example, how the proposed conceptual tool can be used for exploring the vulnerability space of a cryptographic primitive
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