Semiconducting SnO2 nanowires have been used to demonstrate high-quality field-effect transistors, optically transparent devices, photodetectors, and gas sensors. However, controllable assembly of rutile SnO2 nanowires is necessary for scalable and practical device applications. Here, we demonstrate aligned, planar SnO2 nanowires grown on A-plane, M-plane, and R-plane sapphire substrates. These parallel nanowires can reach 100 μm in length with sufficient density to be patterned photolithographically for field-effect transistors and sensor devices. As proof-of-concept, we show that transistors made this way can achieve on/off current ratios on the order of 10(6), mobilities around 71.68 cm(2)/V·s, and sufficiently high currents to drive external organic light-emitting diode displays. Furthermore, the aligned SnO2 nanowire devices are shown to be photosensitive to UV light with the capability to distinguish between 254 and 365 nm wavelengths. Their alignment is advantageous for polarized UV light detection; we have measured a polarization ratio of photoconductance (σ) of 0.3. Lastly, we show that the nanowires can detect NO2 at a concentration of 0.2 ppb, making them a scalable, ultrasensitive gas sensing technology. Aligned SnO2 nanowires offer a straightforward method to fabricate scalable SnO2 nanodevices for a variety of future electronic applications.
Silicon carbide (SiC) porous substrates are prepared by pressureless sintering of SiC powders under an inert atmosphere of argon. The porous SiC substrates were characterized by measuring their porosity, pore size distribution, surface characteristics, and structure. Their transport characteristics were investigated using N 2 and He as the test gases. Three different starting powders and four different sintering aids, Al 2 O 3 , B 4 C, carbon black, and phenolic resin, either by themselves or in combination, were investigated in terms of their ability to prepare good quality substrates. It was found that the porosity, pore size distribution, and transport characteristics of the resulting SiC-sintered bodies depend on the nature of the original powder, the particle size in the green SiC samples, and the type and molar ratio of the sintering aid utilized. Depending on the preparation technique, both mesoporous and macroporous materials could be prepared. These supports are currently utilized for the preparation of microporous membranes.
The crystallography and atomic structure of inversion twin boundaries were studied in polycrystalline ZnO using conventional transmission electron microscopy and high-resolution electron microscopy. Inversion twin boundaries were found to lie on the basal plane. There are eight possible configurations for the inversion boundary. In order to determine the atomic structure of the inversion twin boundary, high-resolution transmission electron images were compared with simulated images. The atomic structure of the inversion boundary was determined to have a head-to-head configuration and its stacking sequence is AaBBAte ArCcuA, where A, B, and C are Zn atomic planes and a, p, and r are 0 planes. A slight contraction of the planes in the boundary region is detected. [
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