The article presents data on assessing metrological support management quality based on the probabilistic approach. Assessing event probability can be additional important information in planning and analyzing complex processes such as metrological management. The analysis was carried out by comparing the requirements for metrological support with information about real situations. Requirements for metrological support are developed on the basis of regulatory legal acts, company management instructions, optimization of resource consumption, as well as taking into account company development prospects. To a large extent, the achievement of metrological support goals depends on management quality. The final step in assessing the quality of metrological support management is development of the results of assessment and formulation of conclusions (recommendations).
The research relates to the field of metrological supervision, specifically to the control of surface roughness parameters. The authors analyzed the following regulatory documents: GOST R ISO 4287-2014 “Geometrical product specifications (GPS). Surface texture. Profile method. Terms, definitions and surface texture parameters”, GOST 25142-82 “Surface roughness. Terms and definitions”, GOST 2789-73 “Surface roughness. Parameters and characteristics”, GOST 9378-93 (ISO 2632-1-85, ISO 2632-2-85) “Roughness comparison specimens. General technical conditions”, GOST 27964-88 (ST SEV 6134-87, ISO 4287 / 2-84) “Measurement of roughness parameters. Terms and definitions”, GOST 19300-86 “Instruments for measurement of surface roughness by the profile method. Contact profilographs and profilometers. Types and main parameters”, GOST R 8.651-2009 ISO “State system for ensuring the uniformity of measurements. Contact (stylus) instruments for the measurement of surface roughness. Procedure of calibration”, GOST 9847-79 “Optical instruments for surface roughness parameters measuring. Basis parameters and types”, GOST R 8.700-2010 “State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope”, which regulate the measured parameters of the surface roughness, instruments that measure these parameters. In the course of a comparative analysis of the values of the parameters of existing devices and the values of the parameters of devices prescribed in the standards, a summary table was formed, and the problem of controlling nanoparameters and nanocoatings was also identified. The existing instrument base for monitoring surface roughness allows measuring parameters with high accuracy and within wide limits, but the regulatory framework on the territory of the Russian Federation is outdated and does not allow the use of some modern types of instruments. In this regard, it is necessary to update the requirements of GOSTs for the modern capabilities of technology and control over roughness parameters.
Based on modern computer technologies developed by National Instruments, a virtual device for adjusting, controlling and studying various noise characteristics has been developed. Signs helping identify the laws of random signal probability distribution are smoothness or sharpen-ing, asymmetry and uncertainty. Examples of identification of noise characteristics of elec-tronic devices are provided; instrument technologies are used to monitor the technical condi-tion of such devices.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.