International audienceFormation of domain structure by electron beam irradiation in congruent lithium niobate covered by surface dielectric layer with planar and channel waveguides produced by Soft Proton Exchange (SPE) process has been studied. Formation of domains with arbitrary shapes as a result of discrete switching has been revealed. The fact was attributed to ineffective screening of depolarization field in the crystals presenting a surface layer modified by the SPE process. The dependences of the domain sizes as a function of the dose and the distance between irradiated areas have been measured. Finally, we have demonstrated that electron beam patterning using surface resist layer can produce high quality periodical poling after channel waveguide fabrication. Second harmonic generation with normalized nonlinear conversion efficiency up to 48%/(W cm 2) has been achieved in such waveguides
We present the results of experimental study of the influence of initial domain state on the shape and size of isolated domains created by the conductive tip of scanning probe microscope during local polarization reversal in relaxor ferroelectric strontium barium niobate doped with nickel and cerium. The domain radius was found to increase with increasing voltage and time and depend on the initial polarization direction. Circular domains of the opposite sign were found to appear due to polarization backswitching. The obtained results can be used for practical applications of domain and domain wall engineering in ferroelectrics.
La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro-and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300 K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243 K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films.
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