A general method for computing harmonic generation in reflection and transmission from planar nonmagnetic multilayer structures is described. The method assumes plane waves and treats harmonic generation in the parametric approximation. The method is applied in studying the second-and third-harmonic generation properties of thin crystal silicon layers surrounded by thermal oxide. Most independent components of the nonlinear susceptibility tensor have unique signatures with silicon layer thickness d, allowing their strength to be determined in principle by measuring harmonic generation as a function of d. Surface and bulk contributions to third-harmonic generation are cleanly distinguished, with the bulk signal dominating. Four of six nonvanishing components of ͑2͒ are independent. An approximate value for the bulk susceptibility component ␦Ј, which is accessible only in multibeam experiments and has not previously been measured, is obtained.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
hi@scite.ai
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.