Graphene produced by exfoliation has not been able to provide an ideal graphene with performance comparable to that predicted by theory, and structural and/or electronic defects have been proposed as one cause of reduced performance. We report the observation of domains on exfoliated monolayer graphene that differ by their friction characteristics, as measured by friction force microscopy. Angle-dependent scanning revealed friction anisotropy with a periodicity of 180° on each friction domain. The friction anisotropy decreased as the applied load increased. We propose that the domains arise from ripple distortions that give rise to anisotropic friction in each domain as a result of the anisotropic puckering of the graphene.

Monolayer graphene is one of the most interesting materials applicable to next-generation electronic devices due to its transport properties. However, realization of graphene devices requires suitable nanoscale lithography as well as a method to open a band gap in monolayer graphene. Nanoscale hydrogenation and oxidation are promising methods to open an energy band gap by modification of surface structures and to fabricate nanostructures such as graphene nanoribbons (GNRs). Until now it has been difficult to fabricate nanoscale devices consisting of both hydrogenated and oxidized graphene because the hydrogenation of graphene requires a complicated process composed of large-scale chemical modification, nanoscale patterning, and etching. We report on nanoscale hydrogenation and oxidation of graphene under normal atmospheric conditions and at room temperature without etching, wet process, or even any gas treatment by controlling just an external bias through atomic force microscope lithography. Both the lithographically defined nanoscale hydrogenation and oxidation have been confirmed by micro-Raman spectroscopy measurements. Patterned hydrogenated and oxidized graphene show insulating behaviors, and their friction values are several times larger than those of graphene. These differences can be used for fabricating electronic or electromechanical devices based on graphene.

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Ripples in graphene monolayers deposited on SiO(2)/Si wafer substrates were recently shown to give rise to friction anisotropy. High friction appears when the AFM tip slides in a direction perpendicular to the ripple crests and low friction when parallel. The direction of the ripple crest is, however, hard to determine as it is not visible in topographic images and requires elaborate measurements of friction as a function of angle. Here we report a simple method to characterize ripple crests by measuring the cantilever torsion signal while scanning in the non-conventional longitudinal direction (i.e., along the cantilever axis, as opposed to the usual friction measurement). The longitudinal torsion signal provides a much clearer ripple domain contrast than the conventional friction signal, while both signals show respective rotation angle dependences that can be explained using the torsion component of the normal reaction force exerted by the graphene ripples. We can also determine the ripple direction by comparing the contrast in torsion images obtained in longitudinal and lateral scans without sample rotation or complicated normalization.