We present an interferometric technique for measurement of the dispersion of birefringence in polarization-maintaining fibers. The approach yields measurements over a broad spectral range from analysis of single interferograms obtained in a tandem inteferometer. The technique is demonstrated to measure first-, second-, and third-order dispersion of the differential propagation constant, corresponding to differential group delay (DGD) and its dispersion to second order; measurements are immune to asymmetry in the interferomgram that is being processed. The technique is further applied to measurement of the temperature dependence of DGD and its first-order dispersion.

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We describe a low-coherence interferometric technique for simultaneous measurement of geometric thickness and group refractive index of highly dispersive samples. The technique is immune to the dispersion-induced asymmetry of the interferograms, thus overcoming limitations associated with some other low-coherence approaches to this simultaneous measurement. We use the experimental configuration of a tandem interferometer, with the samples to be characterized placed in an air gap in one arm of the measurement interferometer. Unambiguous, dispersion-insensitive measurements of critical group-delay imbalances in the measurement interferometer are determined from the optical frequency dependence of interferogram phases, by means of dispersive Fourier transform spectrometry. Sample thickness and group refractive index are calculated from these group delays. A thickness measurement precision of 0.2 microm and group index measurement accuracy of 5 parts in 10(5) across a wavelength range of 150 nm have been achieved for BK7 and fused-silica glass samples in the thickness range 2000 to 6000 microm.

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We report simultaneous measurement of strain and temperature in single-mode optical fiber by broadband interferometry. A Mach-Zehnder interferometer, illuminated by a xenon-arc lamp, has a sensing element in one arm. Scanning an air path generates interferograms that are calibrated by a monochromatic reference interferogram. Values of group delay and dispersion, obtained from the phase of the fast Fourier transform of the sampled interferogram, give strain and temperature through a well-conditioned matrix transformation without phase ambiguity. We obtained measurement ranges and resolutions of 1500 +/- 12 microstrain and 25.0 +/- 0.4 K using a 0.8-m sensing element.