Applied quantum optics stands to revolutionise many aspects of information technology, provided performance can be maintained when scaled up. Silicon quantum photonics satisfies the scaling requirements of miniaturisation and manufacturability, but at 1.55 µm it suffers from problematic linear and nonlinear loss. Here we show that, by translating silicon quantum photonics to the mid-infrared, a new quantum optics platform is created which can simultaneously maximise manufacturability and miniaturisation, while reducing loss. We demonstrate the necessary platform components: photon-pair generation, single-photon detection, and high-visibility quantum interference, all at wavelengths beyond 2 µm. Across various regimes, we observe a maximum net coincidence rate of 448 ± 12 Hz, a coincidence-to-accidental ratio of 25.7 ± 1.1, and, a net two-photon quantum interference visibility of 0.993 ± 0.017. Mid-infrared silicon quantum photonics will bring new quantum applications within reach.
Fiber optic technology connects the world through the Internet, enables remote sensing, and connects disparate functional optical devices. Highly confined silicon photonics promises extreme scale and functional integration. However, the optical modes of silicon nanowire waveguides and optical fibers are very different, making efficient fiber-chip coupling a challenge. Vertical grating couplers, the dominant coupling method today, have limited optical bandwidth and are naturally out-of-plane. Here we demonstrate a new method that is low-loss, broadband, manufacturable, and naturally planar. We adiabatically couple a tapering silicon nanowire waveguide to a conic nanotapered optical fiber, measuring transmission between 2.0 µm and 2.2 µm wavelength. The silicon chip is fabricated at a commercial foundry and then post-processed to release the tapering nanowires. We estimate an optimal per-coupler transmission of −0.48 dB (maximum; 95% confidence interval [+0.46, –1.68] dB) and a 1-dB bandwidth of at least 295 nm. With automated measurements, we quantify the device tolerance to lateral misalignment, measuring a flat response within ±0.968 µm. This new design can enable low-loss modular systems of integrated photonics irrespective of material and waveband.
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