We propose a framework for indexing of grain and subgrain structures in electron backscatter diffraction patterns of polycrystalline materials. We discretize the domain of a dynamical forward model onto a dense grid of orientations, producing a dictionary of patterns. For each measured pattern, we identify the most similar patterns in the dictionary, and identify boundaries, detect anomalies, and index crystal orientations. The statistical distribution of these closest matches is used in an unsupervised binary decision tree (DT) classifier to identify grain boundaries and anomalous regions. The DT classifies a pattern as an anomaly if it has an abnormally low similarity to any pattern in the dictionary. It classifies a pixel as being near a grain boundary if the highly ranked patterns in the dictionary differ significantly over the pixel's neighborhood. Indexing is accomplished by computing the mean orientation of the closest matches to each pattern. The mean orientation is estimated using a maximum likelihood approach that models the orientation distribution as a mixture of Von Mises-Fisher distributions over the quaternionic three sphere. The proposed dictionary matching approach permits segmentation, anomaly detection, and indexing to be performed in a unified manner with the additional benefit of uncertainty quantification.
This paper considers statistical estimation problems where the probability distribution of the observed random variable is invariant with respect to actions of a finite topological group. It is shown that any such distribution must satisfy a restricted finite mixture representation. When specialized to the case of distributions over the sphere that are invariant to the actions of a finite spherical symmetry group G, a groupinvariant extension of the Von Mises Fisher (VMF) distribution is obtained. The G-invariant VMF is parameterized by location and scale parameters that specify the distribution's mean orientation and its concentration about the mean, respectively. Using the restricted finite mixture representation these parameters can be estimated using an Expectation Maximization (EM) maximum likelihood (ML) estimation algorithm. This is illustrated for the problem of mean crystal orientation estimation under the spherically symmetric group associated with the crystal form, e.g., cubic or octahedral or hexahedral. Simulations and experiments establish the advantages of the extended VMF EM-ML estimator for data acquired by Electron Backscatter Diffraction (EBSD) microscopy of a polycrystalline Nickel alloy sample. 1
We propose a segmentation and anomaly detection method for electron backscatter diffraction (EBSD) images. In contrast to conventional methods that require Euler angles to be extracted from diffraction patterns, the proposed method operates on the patterns directly. We use a forward model implemented as a dictionary of diffraction patterns generated by a detailed physics-based simulation of EBSD. The combination of full diffraction patterns and a dictionary allows anomalies to be detected at the same time as grains are segmented, and also increases robustness to noise and instrument blur. The proposed method is demonstrated on a sample of the Ni-base alloy IN100.
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