The ionization of xenon Rydberg atoms at metallic surfaces is examined. The data show that, when the effects of stray electric "patch" fields present on the surface are taken into account, ionization is well described by a simple over-the-barrier model. The patch fields are determined from direct measurements of the potential variations across the target surfaces using Kelvin probe force microscopy. Monte Carlo techniques are used to model the atom-surface interaction. The results confirm the important role that patch fields can play during Rydberg atom-surface interactions and suggest that such interactions can provide a sensitive probe of stray fields at surfaces.
The ionization of xenon Rydberg atoms excited to the lowest-lying state in the n = 17 and 20 Stark manifolds at Au͑111͒ surfaces is investigated as a function of the angle of incidence. Analysis of the data points to the presence of localized stray fields at the surface associated with surface inhomogeneities, which modify the atom-surface separation at which ionization occurs. A simple model is presented to justify this assertion and its implications are discussed.
A simple compact retarding-potential Mott polarimeter is described that operates at an electron accelerating voltage of 25 kV. With a thorium target the instrument provides efficiencies eta [=S2eff(I/I0), where Seff is the effective asymmetry (Sherman) function and I/I0 is the scattering efficiency] of approximately 1.3 x 10(-4) which are similar to the best values obtained using earlier Mott polarimeters. The present instrument, however, occupies a much smaller volume and is suitable for a wide range of applications involving angle- and/or energy-resolved polarization measurements.
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