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A methodology is presented that enables efficient acquisition of sufficient droplet information (e.g. diameter and aspect ratio) from images of in and out of focus droplets. The newly developed multi‐threshold algorithm is successfully implemented in the automatic particle/droplet image analysis (PDIA) system. Under the same optical hardware set‐up, and compared to the dual threshold methods [1], the multi‐threshold method increases the measurable/acceptable depth of field (DoF) of particles, especially for the small particles of diameters less than 50 μm (1098 pixels in this optical set‐up). When testing the 70 μm~110 μm and 100 μm~200 μm moving glass spheres, the dual threshold method can only detect 11%~29 % of the particles found by the multi‐threshold method. The multi‐threshold method is also capable of generating the aspect ratios of particles more accurately than dual threshold methods.

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