Effects of surface roughness on electrical properties of a thin insulating film capacitor with one smooth electrode plate and one rough electrode plate are investigated. The electrode plate roughness is described in terms of self-affine fractal scaling through the roughness exponent ␣, the root-mean square ͑rms͒ roughness amplitude w, and the correlation length. The electric field, capacitance, and leakage current show similar qualitative changes with the roughness parameters: they all increase as w increases, and also increase as either or ␣ decreases. ͓S0163-1829͑99͒10035-3͔

Effects of size on the mechanical response of metallic glasses investigated through in situ TEM bending and compression experiments Chen, C.Q.; Pei, Y.T.; Hosson, J.T.M. De

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