In this paper we present a bilevel optimization scheme for the solution of a general image deblurring problem, in which a parametric variational-like approach is encapsulated within a machine learning scheme to provide a high quality reconstructed image with automatically learned parameters. The ingredients of the variational lower level and the machine learning upper one are specifically chosen for the Helsinki Deblur Challenge 2021, in which sequences of letters are asked to be recovered from out-of-focus photographs with increasing levels of blur. Our proposed procedure for the reconstructed image consists in a fixed number of FISTA iterations applied to the minimization of an edge preserving and binarization enforcing regularized least-squares functional. The parameters defining the variational model and the optimization steps, which, unlike most deep learning approaches, all have a precise and interpretable meaning, are learned via either a similarity index or a support vector machine strategy. Numerical experiments on the test images provided by the challenge authors show significant gains with respect to a standard variational approach and performances comparable with those of some of the proposed deep learning based algorithms which require the optimization of millions of parameters.
In this paper we propose a new algorithm for solving a class of nonsmooth nonconvex problems, which is obtained by combining the iteratively reweighted scheme with a finite number of forward–backward iterations based on a linesearch procedure. The new method overcomes some limitations of linesearch forward–backward methods, since it can be applied also to minimize functions containing terms that are both nonsmooth and nonconvex. Moreover, the combined scheme can take advantage of acceleration techniques consisting in suitable selection rules for the algorithm parameters. We develop the
convergence analysis of the new method within the framework of the Kurdyka-Lojasiewicz property. Finally, we present the results of a numerical experience on microscopy image super resolution, showing that the performances of our method are comparable or superior to those of other algorithms designed for this specific application.
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