X-ray
diffraction is measured on individual bilayer and multilayer
graphene single-crystals and combined with electrochemically induced
lithium intercalation. In-plane Bragg peaks are observed by grazing
incidence diffraction. Focusing the incident beam down to an area
of about 10 μm × 10 μm, individual flakes are probed
by specular X-ray reflectivity. By deploying a recursive Parratt algorithm
to model the experimental data, we gain access to characteristic crystallographic
parameters of the samples. Notably, it is possible to directly extract
the bi/multilayer graphene c-axis lattice parameter.
The latter is found to increase upon lithiation, which we control
using an on-chip peripheral electrochemical cell layout. These experiments
demonstrate the feasibility of in situ X-ray diffraction on individual,
micron-sized single crystallites of few- and bilayer two-dimensional
materials.
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