International audienceThis paper describes the realization and characterization of microwave 3-D printed loads in rectangular waveguide technology. Several commercial materials were characterized at X-band (8-12 GHz). Their dielectric properties were extracted through the use of a cavity-perturbation method and a transmission/reflection rectangular waveguide method. A lossy carbon-loaded Acrylonitrile Butadiene Styrene (ABS) polymer was selected to realize a matched load between 8 and 12 GHz. Two different types of terminations were realized by fused deposition modeling: a hybrid 3-D printed termination (metallic waveguide + pyramidal polymer absorber + metallic short circuit) and a full 3-D printed termination (self-consistent matched load). Voltage standing wave ratio of less than 1.075 and 1.025 were measured over X-band for the hybrid and full 3-D printed terminations, respectively. Power behavior of the full 3-D printed termination was investigated. A very linear evolution of reflected power as a function of incident power amplitude was observed at 10 GHz up to 11.5 W. These 3-D printed devices appear as a very low cost solution for the realization of microwave matched loads in rectangular waveguide technology

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The dielectric properties of a KTa 0.65 Nb 0.35 O 3 ferroelectric composition for a submicronic thin layer were measured in the microwave domain using different electromagnetic characterization methods. Complementary experimental techniques (broadband methods versus resonant techniques, waveguide versus transmission line) and complementary data processing procedures (quasi-static theoretical approaches versus full-wave analysis) were selected to investigate the best way to characterize ferroelectric thin films. The measured data obtained from the cylindrical resonant cavity method, the experimental method that showed the least sources of uncertainty, were taken as reference values for comparisons with results obtained using broadband techniques. The error analysis on the methods used is discussed with regard to the respective domains of validity for each method; this enabled us to identify the best experimental approach for obtaining an accurate determination of the microwave dielectric properties of ferroelectric thin layers.