We investigate the temperature dependence of the optical reflectance anisotropy (RA) of the Au( 110)-(1 × 2) surface and find that transitions involving surfacemodified bulk bands contribute to the RA spectrum. The RA peaks observed at room temperature at photon energies of 3.52 and 4.50 eV are assigned to the transitions E F → L u 1 and L 2 → L u 1 , respectively. The assignments are based upon a comparison between temperature-induced shifts in the energy of these RAS peaks and thermovariation optical spectroscopy results of the temperature dependence of transition energies between bands at the L symmetry point. The application of RAS to Au(110) can be seen as a model system for exploring surfaces in a range of environments including ultra-high vacuum,high pressures and at the solid/liquid interface. The results reported here further the understanding of the RA spectrum of the clean Au(110) surface.
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The optical anisotropy of copper samples undergoing tensile testing is investigated using reflection anisotropy spectroscopy (RAS). The amplitudes of specific RAS spectral features are found to vary differently with strain, indicating sensitivity to distinct piezo-optic mechanisms.1 Introduction The last decade has seen a proliferation in the use of reflection anisotropy spectroscopy (RAS) in the study of surfaces [1]. RAS is a polarisation modulation technique and when implemented using a photoelastic modulator (a phase modulating device) [2] it measures quantities essentially proportional to r * ∆r and |r| 2 , where ∆r is the anisotropy in the complex normal incidence reflectance spectra for two orthogonal linear polarisations, r is the mean reflectance spectrum, and the asterisk denotes complex conjugation. Since r * ∆r and |r| 2 have essentially the same normalisation functions, their ratio provides an accurate measure of the fractional reflectance anisotropy:
The surface sensitivity (in the sub-nanometre regime) of reflection spectroscopies is
discussed. Simulations are used to illustrate the strengths and limitations of 45 degree
reflectometry (45DR). Particular emphasis is placed upon the comparison with
spectroscopic ellipsometry.
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