A quantitative assessment of the bulk-darkening phenomenon for flux-grown KTiOPO(4) is reported. Measurements were made for KTiOPQ(4) use as a component for second-harmonic generation of 1064-nm Nd:YAG radiation operating in a pulsed mode. The results show that the bulk-darkening severity increases with fluence and exposure time. Irreversible bulk darkening has been observed at laser energies ranging from 8.8 to 18 J/cm(2) depending on the shot count. Fluences exceeding 15 J/cm(2) can cause catastrophic damage. Data taken at elevated temperatures indicate an improved reliability. The onset of slight bulk darkening revealed no adverse effects on conversion efficiency.
A 2048 x 16 pixel time delay and integrate (TDI) monolithic focal plane array. detector using PtSi Schottky barrier photodiodes and an interline CCD architecture was developed. A high resolution was achieved by using 30 .t pixels, and a high sensitivity through the TDI mode of operation. A ripple clocked vertical shift register was used for higher charge capacity, allowing a 43% fill factor with a saturated charge capacity of 530,000 electrons.
A quantitative assessment of the bulk darkening phenomenon for flux-grown KTiOPO4 (KTP) is reported.Measurements were made for KTP use as a component for second harmonic generation of 1064 nm Nd:YAG operating in a pulsed mode. The results show that bulk darkening severity increases with fluence and exposure time. Irreversible bulk darkening has been observed at laser energies ranging from 8.8 to 18 J/cm2 depending on the shot count. Fluences exceeding 15 J/cm2 can cause catastrophic damage. Data taken at elevated temperatures indicates an improved reliability. The onset of slight bulk darkening revealed no adverse effects on conversion efficiency.
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