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Polycrystalline titanium samples were implanted with N+ ions at high fluences and at several energies. The aim was to obtain 4000 A thick nitrided layers of constant nominal concentration equal to 20% ,30%, and 40%.The results obtained by RBS showed a flat nitrogen distribution with depth and the measured concentrations were respectively 20%/o,3 1% and 38%.X-ray grazing incidence diffraction indicated that, at 20%, a nitrogen solid solution is formed in the xc-Ti matrix. At 31% the nitrogen solid solution is present besides a 6-TiN phase and at 38% only the 5-TiN phase remains.From nanoindentation measurements, we derived the depth-related hardness and Young's modulus of the implanted samples. These values were compared to those found on titanium nitride layers obtained with other coating techniques.

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