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There is increasing interest in the measurements of the dielectric absorption of compressed solid powders. A theoretical analysis is reported which highlights the problems which may arise due to “lack of contact” between the material and the electrodes. It is demonstrated, both theoretically and experimentally, that spurious dielectric dispersion can be observed in the frequency range of kHz and/or MHz for semiconducting materials even if a slight lack of contact exists between the surface of the sample and the electrodes of the measuring cell.

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