The crystalline polysiloxane (-&SiO-)n, where R = n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electronbeam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 0.01 A and c = 9.40 * 0.05 A. The probable space group is P4, (or P4,).
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