Scanning superconducting quantum interference device (SQUID) microscopy is a magnetic imaging technique combining high field sensitivity with nanometer-scale spatial resolution. Here, we demonstrate a scanning probe that combines the magnetic and thermal imaging provided by an on-tip SQUID with the tip-sample distance control and topographic contrast of a noncontact atomic force microscope (AFM). We pattern the nanometer-scale SQUID, including its weak-link Josephson junctions, via focused-ionbeam milling at the apex of a cantilever coated with Nb, yielding a sensor with an effective diameter of 365 nm, field sensitivity of 9.5 nT/ √ Hz, and thermal sensitivity of 620 nK/ √ Hz, operating in magnetic fields up to 1.0 T. The resulting SQUID-on-lever probe is a robust AFM-like scanning probe that expands the reach of sensitive nanometer-scale magnetic and thermal imaging beyond what is currently possible.